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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits 2nd Edition

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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits 2nd Edition,1439829411,9781439829417

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Book Information

Publisher:Taylor & Francis Group
Published In:2013
ISBN-10:1439829411
ISBN-13:9781439829417
Binding Type:Hardback
Weight:1.52 lbs
Pages:pp. 250

The Title "Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits 2nd Edition" is written by Sandeep K. Goel. This book was published in the year 2013. The ISBN number 1439829411|9781439829417 is assigned to the Hardback version of this title. The book displayed here is a 2nd Edition edition. This book has total of pp. 250 (Pages). The publisher of this title is Taylor & Francis Group. We have about 159342 other great books from this publisher.

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