Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings
by Dit-Yan Yeung
Available
Ships From New York
Free Shipping within U.S.A
International Shipping?
Check Delivery Estimate and
Shipping Cost
for your country
| Publisher: | Springer |
| Published In: | 03-Aug-2006 |
| ISBN-10: | 3540372369 |
| ISBN-13: | 9783540372363 |
| Binding Type: | Paperback |
| Weight: | 2.68 lbs |
| Pages: | pp. 968, Illus. |
The Title "Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings 1st Edition" is written by Dit-Yan Yeung. This book was published in the year 2006. The ISBN number 3540372369|9783540372363 is assigned to the Paperback version of this title. The book displayed here is a 1st Edition edition. This book has total of pp. xxi + 939 (Pages). The publisher of this title is Springer. We have about 138114 other great books from this publisher. Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings 1st Edition is currently Available with us.