Built In Test for VLSI Pseudorandom Techniques
by Paul H. Bardell
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| Publisher: | John Wiley & Sons |
| Published In: | 02-Dec-1987 |
| ISBN-10: | 0471624632 |
| ISBN-13: | 9780471624639 |
| Binding Type: | Hardback |
| Weight: | 1.71 lbs |
| Pages: | pp. 368 |
The Title "Built In Test for VLSI Pseudorandom Techniques" is written by Paul H. Bardell. This book was published in the year 1987. The ISBN number 0471624632|9780471624639 is assigned to the Hardback version of this title. This book has total of PP. 368 (Pages). The publisher of this title is John Wiley & Sons. We have about 122553 other great books from this publisher. Built In Test for VLSI Pseudorandom Techniques is currently Available with us.