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Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications 1st Edition

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Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications 1st Edition,3540253033,9783540253037

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Book Information

Publisher:Springer
Published In:23-Jun-2005
ISBN-10:3540253033
ISBN-13:9783540253037
Binding Type:Hardback
Weight:2.23 lbs
Pages:pp. xxvi + 489

The Title "Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications 1st Edition" is written by Stefan Rein. This book was published in the year 2005. The ISBN number 3540253033|9783540253037 is assigned to the Hardback version of this title. The book displayed here is a 1st Edition edition. This book has total of pp. xxvi + 489 (Pages). The publisher of this title is Springer. We have about 155425 other great books from this publisher. Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications 1st Edition is currently Available with us.

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