The Mega Online Bookstore
Welcome Guest | Login | Home | Contact Us

High-Resolution X-Ray Scattering From Thin Films to Lateral Nanostructures 2nd Edition

by  
High-Resolution X-Ray Scattering From Thin Films to Lateral Nanostructures 2nd Edition,0387400923,9780387400921

Hardback

$ 149.99

$ 90.18
Save $ 59.81

Enquire about this book

Available

Usually Ships in 14 Days.

Ships From New York

Free Shipping within U.S.A

International Shipping?

Check Delivery Estimate and Shipping Cost for your country

Book Information

Publisher:Springer
Published In:29-Sep-2004
ISBN-10:0387400923
ISBN-13:9780387400921
Binding Type:Hardback
Weight:1.68 lbs
Pages:pp. 428, 241 Illus.

The Title "High-Resolution X-Ray Scattering From Thin Films to Lateral Nanostructures 2nd Edition" is written by Ulrich Pietsch. This book was published in the year 2004. The ISBN number 0387400923|9780387400921 is assigned to the Hardback version of this title. The book displayed here is a 2nd Edition edition. This book has total of pp. xvi + 408 (Pages). The publisher of this title is Springer. We have about 138114 other great books from this publisher. High-Resolution X-Ray Scattering From Thin Films to Lateral Nanostructures 2nd Edition is currently Available with us.

Related Books

Advances in X-Ray Analysis Volume 32,0306432366,9780306432361
27 %

Advances in X-Ray Analysi ...

Charles S. Barr ...

List Price: $ 279.99

Our Price: $ 203.28