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Applied Scanning Probe Methods III Characterization

Atomic Force Microscopy/Scanning Tunneling Microscopy 3,0306462974,9780306462979
61 %

Atomic Force Microscopy/S ...

Samuel H. Cohen ...

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Applied Scanning Probe Methods X Biomimetics and Industrial Applications 1st Edition,3540740848,9783540740841
78 %

Applied Scanning Probe Me ...

Bharat Bhushan, ...

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Characterization of Distributions by the Method of Intensively Monotone Operators,3540138579,9783540138570
23 %

Characterization of Distr ...

A. V. Kakosyan, ...

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Identifying Relevant Information for Testing Technique Selection An Instantiated Characterization Schema,1402074352,9781402074356
43 %

Identifying Relevant Info ...

Sira Vegas, Nat ...

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Progress in Nano-Electro Optics IV Characterization of Nano-Optical Materials and Optical Near-Field Interactions,3540232362,9783540232360
28 %

Progress in Nano-Electro ...

Motoichi Ohtsu

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Applied Scanning Probe Methods IX Characterization 1st Edition,3540740821,9783540740827
54 %

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Bharat Bhushan

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Optical Characterization of Solids,3540418032,9783540418030
40 %

Optical Characterization ...

Daniela Dragoma ...

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Applied Scanning Probe Methods XIII Biomimetics and Industrial Applications,3540850481,9783540850489
85 %

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Bharat Bhushan, ...

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Scanning Tunneling Microscopy III Theory of Stm and Related Scanning Probe Methods 2nd Edition,3540608249,9783540608240
76 %

Scanning Tunneling Micros ...

R. Wiesendanger ...

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Applied Scanning Probe Methods VII Biomimetics and Industrial Applications,3540373209,9783540373209
75 %

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Bharat Bhushan, ...

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Topics in Fluorescence Spectroscopy Volume 4: Probe Design and Chemical Sensing,0306447843,9780306447846
50 %

Topics in Fluorescence Sp ...

Joseph R. Lakow ...

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Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications 1st Edition,3540253033,9783540253037
6 %

Lifetime Spectroscopy A M ...

Stefan Rein

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Nanoscale Characterisation of Ferroelectric Materials Scanning Probe Microscopy Approach 1st Edition,3540206620,9783540206620
42 %

Nanoscale Characterisatio ...

M. Alexe, Marin ...

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Particles in Gases and Liquids 3 Detection, Characterization, and Control,0306444852,9780306444852
27 %

Particles in Gases and Li ...

K.L. Mittal

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Scanning Tunneling Microscopy I General Principles and Applications to Clean and Absorbate-Covered Surfaces 2nd Edition,3540584153,9783540584155
34 %

Scanning Tunneling Micros ...

Hans-Joachim Gü ...

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Scanning Probe Microscopy in Nanoscience and Nanotechnology,3642035345,9783642035340
27 %

Scanning Probe Microscopy ...

Bharat Bhushan

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Characterization Techniques of Glasses and Ceramics,3540636579,9783540636571
39 %

Characterization Techniqu ...

Jesús Ma. Rinco ...

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Applications of Analytical Techniques to the Characterization of Materials,0306441896,9780306441899
49 %

Applications of Analytica ...

Sandro Merino, ...

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Handbook of Nanophase and Nanostructured Materials 4 Vols. 1st Edition,030647249X,9780306472497
85 %

Handbook of Nanophase and ...

Z.L. Wang, Yi L ...

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Characterization of Solid Polymers New techniques and developments,0412584905,9780412584909
32 %

Characterization of Solid ...

S.J. Spells

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Polyimides Synthesis, Characterization, and Applications Volume 2,0306416735,9780306416736
29 %

Polyimides Synthesis, Cha ...

K. L. Mittal

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Nondestructive Materials Characterization With Applications to Aerospace Materials,3540405178,9783540405177
37 %

Nondestructive Materials ...

Norbert G. H. M ...

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Impact of Electron and Scanning Probe Microscopy on Materials Research,0792359399,9780792359395
33 %

Impact of Electron and Sc ...

David G. Ricker ...

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Scanning Electron Microscopy of Cerebellar Cortex,0306477114,9780306477119
55 %

Scanning Electron Microsc ...

Orlando Castejó ...

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Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy Route to Femtosecond Ångstrom Technology,3540214461,9783540214465
79 %

Mono-Cycle Photonics and ...

Mikiyo Yamashit ...

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Guided-Wave Optoelectronics Device Characterization, Analysis, and Design,0306451077,9780306451072
34 %

Guided-Wave Optoelectroni ...

Theodor Tamir, ...

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Applied Scanning Probe Methods I,3540005277,9783540005278
40 %

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B. Bhushan, H. ...

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Particles in Gases and Liquids 2 Detection, Characterization, and Control,0306438097,9780306438097
41 %

Particles in Gases and Li ...

K.L. Mittal

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Nondestructive Characterization of Materials IV,0306440474,9780306440472
46 %

Nondestructive Characteri ...

J. F. Bussic(re ...

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