Semiconductor Device and Failure Analysis Using Photon Emission Microscopy 1st Edition
by Wai Kin Chim
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| Publisher: | John Wiley & Sons |
| Published In: | 10-Nov-2000 |
| ISBN-10: | 047149240X |
| ISBN-13: | 9780471492405 |
| Binding Type: | Hardback |
| Weight: | 1.91 lbs |
| Pages: | pp. xv + 269, Illus. |
The Title "Semiconductor Device and Failure Analysis Using Photon Emission Microscopy 1st Edition" is written by Wai Kin Chim. This book was published in the year 2001. The ISBN number 047149240X|9780471492405 is assigned to the Hardback version of this title. The book displayed here is a 1st Edition edition. This book has total of pp. 288 (Pages). The publisher of this title is John Wiley & Sons. We have about 122580 other great books from this publisher.