Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits 2nd Edition
by Sandeep K. Goel, Krishnendu Chakrabarty
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| Publisher: | Taylor & Francis Group |
| Published In: | 2013 |
| ISBN-10: | 1439829411 |
| ISBN-13: | 9781439829417 |
| Binding Type: | Hardback |
| Weight: | 1.52 lbs |
| Pages: | pp. 250 |
The Title "Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits 2nd Edition" is written by Sandeep K. Goel. This book was published in the year 2013. The ISBN number 1439829411|9781439829417 is assigned to the Hardback version of this title. The book displayed here is a 2nd Edition edition. This book has total of pp. 250 (Pages). The publisher of this title is Taylor & Francis Group. We have about 159342 other great books from this publisher.