Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications 1st Edition
by Stefan Rein
Available
Ships From New York
Free Shipping within U.S.A
International Shipping?
Check Delivery Estimate and
Shipping Cost
for your country
| Publisher: | Springer |
| Published In: | 23-Jun-2005 |
| ISBN-10: | 3540253033 |
| ISBN-13: | 9783540253037 |
| Binding Type: | Hardback |
| Weight: | 2.23 lbs |
| Pages: | pp. xxvi + 489 |
The Title "Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications 1st Edition" is written by Stefan Rein. This book was published in the year 2005. The ISBN number 3540253033|9783540253037 is assigned to the Hardback version of this title. The book displayed here is a 1st Edition edition. This book has total of pp. xxvi + 489 (Pages). The publisher of this title is Springer. We have about 155425 other great books from this publisher. Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications 1st Edition is currently Available with us.