Testing Static Random Access Memories Defects, Fault Models and Test Patterns
by Said Hamdioui
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| Publisher: | Springer |
| Published In: | 31-Mar-2004 |
| ISBN-10: | 1402077521 |
| ISBN-13: | 9781402077524 |
| Binding Type: | Hardback |
| Weight: | 1.42 lbs |
| Pages: | pp. 244, Illus. |
The Title "Testing Static Random Access Memories Defects, Fault Models and Test Patterns 1st Edition" is written by Said Hamdioui. This book was published in the year 2004. The ISBN number 1402077521|9781402077524 is assigned to the Hardback version of this title. The book displayed here is a 1st Edition edition. This book has total of pp. 240 (Pages). The publisher of this title is Springer. We have about 138114 other great books from this publisher. Testing Static Random Access Memories Defects, Fault Models and Test Patterns 1st Edition is currently Available with us.